A Modified Method of Nanofabrication Using 2D Semiconductor Materials in Field-Effect Transistor(FET)

AR

Abidur Rahman Wayne State University

2020

5th North American International Conference on Industrial Engineering and Operations Management

Uniqueness of in-situ Single Shot Technique Using Femtosecond Laser Pulses for Measuring Absolute Carrier-Envelope Phase(CEP)

AR

Abidur Rahman Wayne State University

2020

5th North American International Conference on Industrial Engineering and Operations Management