Uniqueness of in-situ Single Shot Technique Using Femtosecond Laser Pulses for Measuring Absolute Carrier-Envelope Phase(CEP)

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Abidur Rahman Wayne State University
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Published in 5th North American International Conference on Industrial Engineering and Operations Management, Detroit, USA
Publisher IEOM Society International
Date of Conferences August 9–11, 2020
ISBN 978-0-9855497-8-7
ISSN/E-ISSN 2169-8767