Intelligent Manufacturing Defect Visual Inspection with Temporal Samples: An Approach of Accumulated Knowledge Graph Reasoning with YOLO Stream-based Detection

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YF
Yiyun Fei Georgia Institute of Technology
MS
Mulang Song Georgia Institute of Technology
SW
Shu Wang TE Connectivity
XD
Xinping Deng TE Connectivity
RJ
Roger Jiao Georgia Tech
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Published in 10th North American Conference on Industrial Engineering and Operations Management, Orlando, Florida, United States
Publisher IEOM Society International
Date of Conferences June 17–19, 2025
DOI 10.46254/NA10.20250325
ISBN 979-8-3507-4448-4
ISSN/E-ISSN 2169-8767