Quality

A new lot sentencing method for products with multiple quality characteristics based on process yield

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SL
Shih-Wen Liu National Chin-Yi University of Technology
CW
CHIEN-WEI WU National Tsing Hua University
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Published in 7th North American International Conference on Industrial Engineering and Operations Management, Orlando, USA
Publisher IEOM Society International
Date of Conferences June 11–14, 2022
DOI 10.46254/NA07.20220126
ISBN 978-1-7923-9158-3
ISSN/E-ISSN 2169-8767