7th North American International Conference on Industrial Engineering and Operations Management

A new lot sentencing method for products with multiple quality characteristics based on process yield

Shih-Wen Liu & CHIEN-WEI WU
Publisher: IEOM Society International
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Track: Quality

Published in: 7th North American International Conference on Industrial Engineering and Operations Management, Orlando, USA

Publisher: IEOM Society International
Date of Conference: June 11 -14 , 2022

ISBN: 978-1-7923-9158-3
ISSN/E-ISSN: 2169-8767