Reducing Model Exposure Risk Through AI-Governed Feature Access Control

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CG
Chhaya Gunawat DevOps Leader, Amazon, USA
JN
Jay Sunil Nankani Redfin
PG
Prathana Gunawat Amazon
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Published in 16th International Conference on Industrial Engineering and Operations Management, Ankara, Türkiye
Publisher IEOM Society International
Date of Conferences June 23–26, 2026
DOI 10.46254/AN16.20260018
ISBN 979-8-9958771-3-4
ISSN/E-ISSN 2169-8767