End-to-End Computer Vision Pipeline for Perforation Defect Detection and Classification in Industrial Imaging

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JY
Joanne Yun University of Wisconsin-Madison
HO
Hasnaa Ouidadi
KA
Khawlah Alharbi
PZ
Pengyu Zhang
HQ
Hantang Qin
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Published in 11th North American International Conference on Industrial Engineering and Operations Management, Milwaukee, United States
Publisher IEOM Society International
Date of Conferences June 9–11, 2026
DOI 10.46254/NA11.20260335
ISBN 979-8-9958771-2-7
ISSN/E-ISSN 2169-8767