8th North America Conference on Industrial Engineering and Operations Management

Designing QCD jig Risk Mitigation Strategies in Electronics Manufacturing Companies by Combining House of Risk (HOR) and Ishikawa Diagram Methods

M Khoirul Khuluk & Teuku Yuri M. Zagloel
Publisher: IEOM Society International
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Track: Manufacturing

Published in: 8th North America Conference on Industrial Engineering and Operations Management , Houston, United States of America

Publisher: IEOM Society International
Date of Conference: June 13 -15 , 2023

ISBN: 979-8-3507-0546-1
ISSN/E-ISSN: 2169-8767