2nd North American International Conference on Industrial Engineering and Operations Management

IMPROVING SEMICONDUCTOR BACK-END FINAL TEST THROUGHPUT VIA RFID-BASED LOT CONTROL SYSTEM

Rosnah Mohd Yusuff
Publisher: IEOM Society International
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Track: Operations Management

Published in: 2nd North American International Conference on Industrial Engineering and Operations Management

Publisher: IEOM Society International
Date of Conference: September 23 -26 , 2016

ISBN: 978-0-9855497-5-6
ISSN/E-ISSN: 2169-8767