First of all, this is the first time that I publish this research after many years of 8D methodology practitioner (more than 1200 reports) on semiconductor, automotive wiring systems and plastics industries. I hope that will be helpful and by the way, one cogitates (think deeply) item to develop in the future. I present the experimental design of DINNA Diagram (Double Ishikawa and Naze Naze Analysis) discussing the novel approach we have taken to defect and root cause classification and the mechanisms we have used to connect between the different diagrams. We then present the results of our analyses and describe the best way to get it. We conclude with lessons learned from the methodology and resulting ongoing improvement activities.