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Dr. YoungJun Yoo

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South Korea Korea Institute of Industrial Technology
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A Generalizable Framework for Print Defect Detection using Frequency Filtering and Data-Driven Feature Selection
WonWoo No Korea Institute of Industrial Technology
Hyunchuul Tae KITECH
YoungJun Yoo Korea Institute of Industrial Technology
JongHyun Kim Korea Institute of Industrial Technology
+1 more
2026
7th Asia Pacific Conference on Industrial Engineering and Operations Management