2nd European International Conference on Industrial Engineering and Operations Management

Designing of New Attribute Control Chart with Multiple Dependent State Sampling using a Cost Model Based on Loss Functions

Samrad Jafarian-Namin
Publisher: IEOM Society International
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Track: Quality Engineering, Control and Management
Abstract

The np control chart is used to monitor the number of nonconforming items in a sample. A new np control chart was introduced recently by utilizing the information on the past subgroups via the idea of multiple dependent state sampling. Unlike traditional control charts, this chart is known with two pairs of control limits. This paper proposes an economic model with statistical constraints based on Lorenzen & Vance cost function in order to determine best design parameters of the new np chart. Moreover, the model is extended under linear, quadratic, exponential, and inverted normal loss functions. Accordingly, the same magnitude of deviations from the target results in different quality costs. A solution procedure is presented for optimally specification of five design parameters. Based on numerical studies, the algorithm procedure is illustrated and some comparisons are made to evaluate the performances of economic design (ED) versus economic-statistical design (ESD). The sensitivity of the optimal cost and the chart parameters for different loss functions and input parameters is investigated. The results have indication of significant improvement in statistical performance for ESD despite a small increase in cost due to the statistical constraints added to ED

Published in: 2nd European International Conference on Industrial Engineering and Operations Management, Paris, France

Publisher: IEOM Society International
Date of Conference: July 26-27, 2018

ISBN: 978-1-5323-5945-3
ISSN/E-ISSN: 2169-8767