2nd European International Conference on Industrial Engineering and Operations Management

A method to measure Overall Material Efficiency in Semiconductor Backend Manufacturing Environment

Ho Hwa (Howard) Tang
Publisher: IEOM Society International
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Track: Inventory Management
Abstract

The following paper introduces the Overall Material Efficiency (OME), a performance-measurement concept for material usage in semiconductor manufacturing. The OME breaks down’ the total material usage into main categories. The concept has proven useful to drive improvement in material management by highlighting areas for improvement, via tracking both the amount and cost of materials used in each category over time. The OME is also generic – the authors believe that the concept is relevant to all processes that involve production.

 

Keywords: overall material efficiency, material efficiency, material productivity, material losses

 

Published in: 2nd European International Conference on Industrial Engineering and Operations Management, Paris, France

Publisher: IEOM Society International
Date of Conference: July 26-27, 2018

ISBN: 978-1-5323-5945-3
ISSN/E-ISSN: 2169-8767