5th African conference on Industrial Engineering and Operations Management, South Africa

Reducing Product Defects through Statistical Process Control Implementation

Ngaka Mosia
Publisher: IEOM Society International
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Abstract

The This research proposal seeks to investigate the effectiveness of implementing Statistical Process Control (SPC) in mitigating product defects within the manufacturing facilities. The research will encompass a comprehensive examination of the current state of product defects. An exploration of the theoretical foundations and potential advantages associated with SPC adoption, an assessment of the practical application of SPC methodologies, and the formulation of recommendations for the successful integration of SPC practices within the company's manufacturing plants will be engaged. The research will employ a mixed-methods approach, combining quantitative data collection through the analysis of product defect records and quality control reports with qualitative data gathering via interviews and surveys involving plant managers and quality control personnel. The study's outcomes are anticipated to contribute significantly to the existing body of knowledge related to quality control in the manufacturing sector. Moreover, it aims to provide practical insights tailored to the specific needs of ABX Holdings, with the ultimate goal of reducing product defects. By identifying the root causes of defects and implementing effective SPC techniques, ABX Holdings can elevate product quality, enhance customer satisfaction, and streamline operational processes. This research endeavor aims to furnish ABX Holdings with valuable insights and targeted recommendations, enabling the company to make well-informed decisions and implement strategies that bolster manufacturing performance while minimizing product defects.

Published in: 5th African conference on Industrial Engineering and Operations Management, South Africa, Johannesburg, South Africa

Publisher: IEOM Society International
Date of Conference: April 23-26, 2024

ISBN: 979-8-3507-0549-2
ISSN/E-ISSN: 2169-8767