8th North America Conference on Industrial Engineering and Operations Management

Designing QCD jig Risk Mitigation Strategies in Electronics Manufacturing Companies by Combining House of Risk (HOR) and Ishikawa Diagram Methods

M Khoirul Khuluk & Teuku Yuri M. Zagloel
Publisher: IEOM Society International
0 Paper Citations
Track: Manufacturing

Industrial electronic manufacturers must survive to encounter the effect of Covid-19 and the 2023 global recession. Many companies initiate designing risk mitigation strategies for their production systems. Jig is one part of production systems and special tools which has a function to support production set up easier and ensure uniformity in the shape and size of products in large quantities and shorten production time. Risk mitigation is the risk identification process, arranging risk, and establishing strategies to manage risk prevention action. Risk mitigation must consider quality, cost, and delivery aspects. This paper establishes risk mitigation strategies using two combination methods, House of Risk and The Ishikawa Diagram. House of Risk is a modification method from FMEA and QFD that prioritizes risk sources for the most effective action to decrease risk sources and the impact of risk damage. Ishikawa Diagram is the method from Lean Manufacturing that solves problems intended to identify root cause problems. Both methods combined two steps analysis, using the data obtained through interviews, literature study, and questionnaire. The first step is to identify risk incidents and problems using the HOR, then ranking and analyzing them using Pareto and Ishikawa Diagram. After it's done and get conclusion, the data is used for the second step analysis to identify risk prevention strategies and the effectiveness ratio of the strategy using the HOR and ranked with a Pareto Diagram and set of mitigation actions or strategies based on quality, cost, and delivery aspects.

Published in: 8th North America Conference on Industrial Engineering and Operations Management , Houston, United States of America

Publisher: IEOM Society International
Date of Conference: June 13-15, 2023

ISBN: 979-8-3507-0546-1
ISSN/E-ISSN: 2169-8767